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Volumn 45, Issue , 2013, Pages 32-40

A TOF-SIMS surface chemical analytical study of rare earth element minerals from micro-flotation tests products

Author keywords

Flotation; Rare earth minerals; SEM EDX; Surface chemistry; TOF SIMS

Indexed keywords

ANALYTICAL STUDIES; CONCENTRATION LEVELS; FEED SAMPLES; GRAIN COMPOSITION; LAKE DEPOSITS; MINERAL PHASIS; MINERAL RECOVERY PROCESS; MINERAL SURFACES; ORE MINERALOGY; SEM-EDX; SEM-EDX ANALYSIS; SIGNAL INTENSITIES; SPECTRAL FINGERPRINTING; STATISTICALLY SIGNIFICANT DIFFERENCE; SURFACE CHEMICALS; SURFACE SPECIES; TOF SIMS; TOF-SIMS ANALYSIS; WORLD CLASS;

EID: 84874679667     PISSN: 08926875     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mineng.2013.01.011     Document Type: Article
Times cited : (20)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.