SIMS and XPS study of the adsorption of sulfide collectors on pyroxene: A case for inadvert metal in activation

Colloids and Surfaces A: Physicochemical and Engineering Aspects

Volumn 116, Issue 3, 1996, Pages 241-249

  Nagaraj, D R ^a   Brinen, J S ^a  

^a CYTEC INDUSTRIES INC   (United States)

Author keywords

adsorption; inadvertent metal ion activation; pyroxene; secondary ion mass spectroscopy; sulfide collectors; X ray photoelectron spectroscopy

Indexed keywords

CHEMICAL ACTIVATION; COPPER; IONS; MOLECULAR DYNAMICS; ORGANIC COMPOUNDS; SECONDARY ION MASS SPECTROMETRY; SILICATES; X RAY PHOTOELECTRON SPECTROSCOPY;

INADVERTENT METAL ION ACTIVATION; PYROXENE; SULFIDE COLLECTORS; THIOCARBAMATE; XANTHATE;

ADSORPTION;

PYROXENE; UNCLASSIFIED DRUG;

ARTICLE; MASS SPECTROMETRY; PRIORITY JOURNAL;

EID: 0030607103     PISSN: 09277757     EISSN: None     Source Type: Journal    
DOI: 10.1016/0927-7757(95)03503-6     Document Type: Article

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