Formal methods for early analysis of functional reliability in component-based embedded applications

IEEE Embedded Systems Letters

Volumn 5, Issue 1, 2013, Pages 8-11

  Hazra, Aritra ^a   Ghosh, Priyankar ^a   Vadlamudi, S G ^a   Chakrabarti, P P ^a   Dasgupta, Pallab ^a  

^a INDIAN INSTITUTE OF TECHNOLOGY   (India)

Author keywords

Design and validation; embedded system; functional reliability; reliability gap

Indexed keywords

COMPONENT BASED; COMPONENT BASED DESIGN; ELEVATOR CONTROL; EMBEDDED APPLICATION; FUNCTIONAL PROPERTIES; RELIABILITY REQUIREMENTS;

COMPUTER SCIENCE; EMBEDDED SYSTEMS;

RELIABILITY;

EID: 84874600365     PISSN: 19430663     EISSN: None     Source Type: Journal    
DOI: 10.1109/LES.2013.2239605     Document Type: Article

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