Does one rotten apple spoil the whole barrel?

Proceedings - International Conference on Pattern Recognition

Volumn , Issue , 2012, Pages 1156-1159

  Cheplygina, Veronika ^a   Tax, David M J ^a   Loog, Marco ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

MULTIPLE-INSTANCE LEARNING;

SOFTWARE ENGINEERING;

PATTERN RECOGNITION;

EID: 84874579195     PISSN: 10514651     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (12)

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