-
1
-
-
31144462939
-
Hall effect of quasi-hole gas in organic single-crystal transistors
-
DOI 10.1143/JJAP.44.L1393
-
J. Takeya, K. Tsukagoshi, Y. Aoyagi, T. Takenobu, and Y. Iwasa, Jpn. J. Appl. Phys. 44, L1393 (2005). JAPNDE 0021-4922 10.1143/JJAP.44.L1393 (Pubitemid 43185005)
-
(2005)
Japanese Journal of Applied Physics, Part 2: Letters
, vol.44
, Issue.46-49
-
-
Takeya, J.1
Tsukagoshi, K.2
Aoyagi, Y.3
Takenobu, T.4
Iwasa, Y.5
-
2
-
-
28844477042
-
Hall effect in the accumulation layers on the surface of organic semiconductors
-
DOI 10.1103/PhysRevLett.95.226601, 226601
-
V. Podzorov, E. Menard, J. A. Rogers, and M. E. Gershenson, Phys. Rev. Lett. 95, 226601 (2005). PRLTAO 0031-9007 10.1103/PhysRevLett.95.226601 (Pubitemid 41776998)
-
(2005)
Physical Review Letters
, vol.95
, Issue.22
, pp. 1-4
-
-
Podzorov, V.1
Menard, E.2
Rogers, J.A.3
Gershenson, M.E.4
-
3
-
-
34547365184
-
In-crystal and surface charge transport of electric-field-induced carriers in organic single-crystal semiconductors
-
DOI 10.1103/PhysRevLett.98.196804
-
J. Takeya, J. Kato, K. Hara, M. Yamagishi, R. Hirahara, K. Yamada, Y. Nakazawa, S. Ikehata, K. Tsukagoshi, Y. Aoyagi, T. Takenobu, and Y. Iwasa, Phys. Rev. Lett. 98, 196804 (2007). PRLTAO 0031-9007 10.1103/PhysRevLett.98.196804 (Pubitemid 47139477)
-
(2007)
Physical Review Letters
, vol.98
, Issue.19
, pp. 196804
-
-
Takeya, J.1
Kato, J.2
Hara, K.3
Yamagishi, M.4
Hirahara, R.5
Yamada, K.6
Nakazawa, Y.7
Ikehata, S.8
Tsukagoshi, K.9
Aoyagi, Y.10
Takenobu, T.11
Iwasa, Y.12
-
4
-
-
77955381046
-
-
PRBMDO 1098-0121 10.1103/PhysRevB.81.161306
-
M. Yamagishi, J. Soeda, T. Uemura, Y. Okada, Y. Takatsuki, T. Nishikara, Y. Nakazawa, I. Doi, K. Takimiya, and J. Takeya, Phys. Rev. B 81, 161306(R) (2010). PRBMDO 1098-0121 10.1103/PhysRevB.81.161306
-
(2010)
Phys. Rev. B
, vol.81
-
-
Yamagishi, M.1
Soeda, J.2
Uemura, T.3
Okada, Y.4
Takatsuki, Y.5
Nishikara, T.6
Nakazawa, Y.7
Doi, I.8
Takimiya, K.9
Takeya, J.10
-
5
-
-
84856487972
-
-
PRBMDO 1098-0121 10.1103/PhysRevB.85.035313
-
T. Uemura, M. Yamagishi, J. Soeda, Y. Takatsuki, Y. Okada, Y. Nakazawa, and J. Takeya, Phys. Rev. B 85, 035313 (2012). PRBMDO 1098-0121 10.1103/PhysRevB.85.035313
-
(2012)
Phys. Rev. B
, vol.85
, pp. 035313
-
-
Uemura, T.1
Yamagishi, M.2
Soeda, J.3
Takatsuki, Y.4
Okada, Y.5
Nakazawa, Y.6
Takeya, J.7
-
6
-
-
84855465064
-
-
PRBMDO 1098-0121 10.1103/PhysRevB.84.245308
-
Y. Okada, K. Sakai, T. Uemura, Y. Nakazawa, and J. Takeya, Phys. Rev. B 84, 245308 (2011). PRBMDO 1098-0121 10.1103/PhysRevB.84.245308
-
(2011)
Phys. Rev. B
, vol.84
, pp. 245308
-
-
Okada, Y.1
Sakai, K.2
Uemura, T.3
Nakazawa, Y.4
Takeya, J.5
-
7
-
-
17944364367
-
Hydrostatic pressure dependence of charge carrier transport in single-crystal rubrene devices
-
DOI 10.1063/1.1875761, 123501
-
Z. Rang, M. I. Nathan, P. P. Ruden, V. Podzorov, M. E. Gershenson, C. R. Newman, and C. Daniel Frisbie, Appl. Phys. Lett. 86, 123501 (2005). APPLAB 0003-6951 10.1063/1.1875761 (Pubitemid 40596948)
-
(2005)
Applied Physics Letters
, vol.86
, Issue.12
, pp. 1-3
-
-
Rang, Z.1
Nathan, M.I.2
Ruden, P.P.3
Podzorov, V.4
Gershenson, M.E.5
Newman, C.R.6
Frisbie, C.D.7
-
8
-
-
12944291058
-
Hydrostatic-pressure dependence of organic thin-film transistor current versus voltage characteristics
-
DOI 10.1063/1.1829388
-
Z. Rang, M. I. Nathan, P. P. Ruden, R. Chesterfield, and C. Daniel Frisbie, Appl. Phys. Lett. 85, 5760 (2004). APPLAB 0003-6951 10.1063/1.1829388 (Pubitemid 40173583)
-
(2004)
Applied Physics Letters
, vol.85
, Issue.23
, pp. 5760-5762
-
-
Rang, Z.1
Nathan, M.I.2
Ruden, P.P.3
Chesterfield, R.4
Frisbie, C.D.5
-
9
-
-
0031549963
-
-
JCRGAE 0022-0248 10.1016/S0022-0248(97)00370-9
-
Ch. Kloc, P. G. Simpkins, T. Siegrist, and R. A. Laudise, J. Cryst. Growth 182, 416 (1997). JCRGAE 0022-0248 10.1016/S0022-0248(97)00370-9
-
(1997)
J. Cryst. Growth
, vol.182
, pp. 416
-
-
Kloc, Ch.1
Simpkins, P.G.2
Siegrist, T.3
Laudise, R.A.4
-
10
-
-
84874546907
-
-
See Supplemental Material at http://link.aps.org/supplemental/10.1103/ PhysRevLett.110.096603 for the x-ray diffraction pattern of DNTT powder under pressurization.
-
-
-
-
11
-
-
0036870876
-
-
PRBMDO 0163-1829 10.1103/PhysRevB.66.174104
-
M. Oehzelt, R. Resel, and A. Nakayama, Phys. Rev. B 66, 174104 (2002). PRBMDO 0163-1829 10.1103/PhysRevB.66.174104
-
(2002)
Phys. Rev. B
, vol.66
, pp. 174104
-
-
Oehzelt, M.1
Resel, R.2
Nakayama, A.3
-
12
-
-
33748317804
-
Crystal structure of oligoacenes under high pressure
-
DOI 10.1103/PhysRevB.74.104103
-
M. Oehzelt, A. Aichholzer, R. Resel, G. Heimel, E. Venuti, and R. G. Della Valle, Phys. Rev. B 74, 104106 (2006). PRBMDO 1098-0121 10.1103/PhysRevB.74.104103 (Pubitemid 44330981)
-
(2006)
Physical Review B - Condensed Matter and Materials Physics
, vol.74
, Issue.10
, pp. 104103
-
-
Oehzelt, M.1
Aichholzer, A.2
Resel, R.3
Heimel, G.4
Venuti, E.5
Della Valle, R.G.6
-
13
-
-
77249145493
-
-
JPCCCK 1932-7447 10.1021/jp910102f
-
R. S. Sanchez-Carrera, S. Atahan, J. Schrier, and A. Aspuru-Guzik, J. Phys. Chem. C 114, 2334 (2010). JPCCCK 1932-7447 10.1021/jp910102f
-
(2010)
J. Phys. Chem. C
, vol.114
, pp. 2334
-
-
Sanchez-Carrera, R.S.1
Atahan, S.2
Schrier, J.3
Aspuru-Guzik, A.4
-
14
-
-
66749146018
-
-
APPLAB 0003-6951 10.1063/1.3153119
-
M. Uno, Y. Tominari, M. Yamagishi, I. Doi, E. Miyazaki, K. Takimiya, and J. Takeya, Appl. Phys. Lett. 94, 223308 (2009). APPLAB 0003-6951 10.1063/1.3153119
-
(2009)
Appl. Phys. Lett.
, vol.94
, pp. 223308
-
-
Uno, M.1
Tominari, Y.2
Yamagishi, M.3
Doi, I.4
Miyazaki, E.5
Takimiya, K.6
Takeya, J.7
-
15
-
-
84874510761
-
-
(unpublished)
-
K. Sakai, Y. Okada, S. Kitaoka, T. Uemura, Y. Ohishi, A. Fujiwara, and J. Takeya (unpublished).
-
-
-
Sakai, K.1
Okada, Y.2
Kitaoka, S.3
Uemura, T.4
Ohishi, Y.5
Fujiwara, A.6
Takeya, J.7
-
17
-
-
84874513105
-
-
(unpublished).
-
Y. Okada, K. Sakai, S. Kitaoka, T. Uemura, Y. Ohishi, A. Fujiwara, and J. Takeya (unpublished).
-
-
-
Okada, Y.1
Sakai, K.2
Kitaoka, S.3
Uemura, T.4
Ohishi, Y.5
Fujiwara, A.6
Takeya, J.7
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