Substrate-modified scattering properties of silicon nanostructures for solar energy applications

Optics Express

Volumn 21, Issue 4, 2013, Pages 4774-4782

  Fofang, N T ^a   Luk, T S ^a   Okandan, M ^a   Nielson, G N ^a   Brener, I ^a  

^a SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANGULAR DISTRIBUTION; NANOSTRUCTURES; SILICON; SILICON SOLAR CELLS; SUBSTRATES; THIN FILMS;

ANGULAR SCATTERING; DIPOLE RESONANCES; FDTD SIMULATIONS; LIGHT-TRAPPING; SCATTERING ANGLES; SCATTERING PROPERTY; SILICON NANO STRUCTURES; SILICON SUBSTRATES; SOLAR ENERGY APPLICATIONS; THIN-FILM SILICON SOLAR CELLS;

SCATTERING;

NANOMATERIAL; SILICON;

CHEMISTRY; COMPUTER AIDED DESIGN; DEVICE FAILURE ANALYSIS; DEVICES; EQUIPMENT DESIGN; LIGHT; MATERIALS TESTING; NANOTECHNOLOGY; OPTICAL INSTRUMENTATION; POWER SUPPLY; RADIATION RESPONSE; RADIATION SCATTERING; REFRACTOMETRY; SOLAR ENERGY; ARTICLE; EQUIPMENT; EQUIPMENT FAILURE; RADIATION EXPOSURE;

COMPUTER-AIDED DESIGN; ELECTRIC POWER SUPPLIES; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; LENSES; LIGHT; MATERIALS TESTING; NANOSTRUCTURES; NANOTECHNOLOGY; REFRACTOMETRY; SCATTERING, RADIATION; SILICON; SOLAR ENERGY;

EID: 84874540426     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.21.004774     Document Type: Article

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