Vacancy-induced ferromagnetism in SnO2 nanocrystals: A positron annihilation study

Chinese Physics Letters

Volumn 30, Issue 2, 2013, Pages

  Chen, Zhi Yuan ^a,b   Chen, Zhi Quan ^b   Pan, Rui Kun ^c   Wang, Shao Jie ^b  

^a HUBEI UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

^b WUHAN UNIVERSITY   (China)

^c HUBEI UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

FERROMAGNETISM; GRAIN BOUNDARIES; NANOCRYSTALS; OXIDE MINERALS; POSITRONS; TITANIUM DIOXIDE; VACANCIES;

ANNEALED SAMPLES; ANNEALING TEMPERATURES; GRAINSIZE; INTERFACIAL DEFECT; NANO POWDERS; POSITRON ANNIHILATION MEASUREMENTS; SINGLE PHASIS; TETRAGONAL RUTILE STRUCTURE; VACANCY DEFECTS; XRD;

ANNEALING;

EID: 84874289292     PISSN: 0256307X     EISSN: 17413540     Source Type: Journal    
DOI: 10.1088/0256-307X/30/2/027804     Document Type: Article

References (17)

1. Ogale S B et al 2003 Phys. Rev. Lett. 91 077205
2. Nomura K, Barrero C A, Sakuma J and Takeda M 2007 Phys. Rev. B 75 184411
3. Espinosa A et al 2011 J. Phys. Chem. C 115 24054
4. Sundaresan A et al 2006 Phys. Rev. B 74 161306 (Pubitemid 44607508)
5. Zhang L, Ge S H and Zuo Y L 2010 J. Electrochem. Soc. 157 K162
6. Hong N H, Sakai J, Poirot N and Brize V 2006 Phys. Rev. B 73 132404 (Pubitemid 43563387)
7. Sundaresan A and Rao C N R 2009 Nano Today 4 96
8. Zhao Q, Wu P, Li B L, Lu Z M and Jiang E Y 2008 Chin. Phys. Lett. 25 1811
9. Rahman G, García-Suárez V M and Hong S C 2008 Phys. Rev. B 78 184404
10. Krause Rehberg R and Leipner H S 1999 Positron Annihilation in Semiconductors, Defect Studies, Springer Series in Solid-State Sciences vol 127 (Berlin: Springer)
11. Cullity B D 1978 Elements X-Ray Diffraction (Philippines: Addison-Wesley) p 284
12. Ansari S G et al 2009 Rev. Sci. Instrum. 80 045112
13. Wang J X et al 2004 Solid State. Commun. 130 89
14. Kirkegaard P, Pedersen N J and Eldrup M 1989 Risø National Laboratory (Roskilde, Denmark)
15. Shek C H, Lai J K L and Lin G M 1999 J. Phys. Chem. Solids 60 189
16. Groza J R 1999 Nanostruct. Mater. 12 987
17. Soininen E et al 1990 Phys. Rev. B 41 6227