A novel and flexible test stand for medium voltage drives using a hardware-in-loop (HIL) simulator

PCIM Europe Conference Proceedings

Volumn , Issue , 2012, Pages 846-852

  Ata, Douzdouzani ^a   Weihua, Wang ^b   Jean, Belanger ^b   Christian, Dufour ^b  

^a ABB SWITZERLAND LTD   (Switzerland)

^b OPAL RT TECHNOLOGIES   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

COMPLEX TOPOLOGY; CONTROL STRATEGIES; FIELD TESTING; HARDWARE-IN-LOOP; MEDIUM VOLTAGE DRIVES; OPTIMIZED DESIGNS; SYSTEM ARCHITECTURES; TEST STANDS;

ENERGY MANAGEMENT; EXHIBITIONS; FIRMWARE; HARDWARE; INTELLIGENT ROBOTS; POWER ELECTRONICS;

TESTING;

EID: 84874141795     PISSN: None     EISSN: 21913358     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)

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