Geometric charts with estimated control limits

Quality and Reliability Engineering International

Volumn 29, Issue 2, 2013, Pages 209-223

  Zhang, Min ^a   Peng, Yiming ^b   Schuh, Anna ^c   Megahed, Fadel M ^c   Woodall, William H ^b  

^a TIANJIN UNIVERSITY   (China)

^b VIRGINIA POLYTECHNIC INSTITUTE AND STATE UNIVERSITY   (United States)

^c Virginia Polytechnic Institute and State University   (United States)

Author keywords

average number of observations to signal; cumulative count of conforming; g chart; high yield processes; run length performance; statistical process control

Indexed keywords

AVERAGE NUMBERS; CUMULATIVE COUNT OF CONFORMING; G-CHART; HIGH-YIELD PROCESS; RUN-LENGTH PERFORMANCE;

ESTIMATION; FLOWCHARTING; SAMPLING; STATISTICAL PROCESS CONTROL; STATISTICS;

GEOMETRY;

EID: 84874116614     PISSN: 07488017     EISSN: 10991638     Source Type: Journal    
DOI: 10.1002/qre.1304     Document Type: Review

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