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Volumn 14, Issue , 2013, Pages

Empirical Bayesian LASSO-logistic regression for multiple binary trait locus mapping

Author keywords

Bayesian shrinkage; Binary traits; Epistatic effects; Logistic regression; QTL mapping

Indexed keywords

ALGORITHM; ARTICLE; BAYES THEOREM; COMPUTER PROGRAM; CONTROLLED STUDY; EPISTASIS; FALSE POSITIVE RESULT; GENETIC MARKER; GENETIC TRAIT; GENOTYPE; LOGISTIC REGRESSION ANALYSIS; MICROCOMPUTER; QUANTITATIVE TRAIT LOCUS MAPPING; SIMULATION;

EID: 84873739129     PISSN: None     EISSN: 14712156     Source Type: Journal    
DOI: 10.1186/1471-2156-14-5     Document Type: Article
Times cited : (19)

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