An EM algorithm for mapping quantitative resistance loci

Heredity

Volumn 94, Issue 1, 2005, Pages 119-128

  Xu, C ^a   Zhang, Y M ^a   Xu, S ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

ECM algorithm; Maximum likelihood; Ordinal trait; Quantitative resistance locus

Indexed keywords

DISEASE RESISTANCE; MOLECULAR ANALYSIS;

ALGORITHM; ARTICLE; COMPUTER SIMULATION; GENETICS; INNATE IMMUNITY; MICROBIOLOGY; PLANT DISEASE; QUANTITATIVE TRAIT LOCUS; STATISTICAL MODEL;

ALGORITHMS; COMPUTER SIMULATION; IMMUNITY, NATURAL; LIKELIHOOD FUNCTIONS; PLANT DISEASES; QUANTITATIVE TRAIT LOCI;

EID: 11144285573     PISSN: 0018067X     EISSN: None     Source Type: Journal    
DOI: 10.1038/sj.hdy.6800583     Document Type: Article

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