메뉴 건너뛰기




Volumn 49, Issue 16, 2013, Pages 1645-1647

Helium ion microscopy: A new tool for imaging novel mesoporous silica and organosilica materials

Author keywords

[No Author keywords available]

Indexed keywords

BENZENESILICA; ETHYLENESILICA; HELIUM; SILICON DIOXIDE; UNCLASSIFIED DRUG;

EID: 84873309288     PISSN: 13597345     EISSN: 1364548X     Source Type: Journal    
DOI: 10.1039/c3cc38569h     Document Type: Article
Times cited : (22)

References (24)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.