-
1
-
-
0031235090
-
Surface metrology
-
PII S0957023397703084
-
Whitehouse, DJ. (1997). Surface metrology. Measurement Science and Technology, 8 (9), 955-972. (Pubitemid 127555373)
-
(1997)
Measurement Science and Technology
, vol.8
, Issue.9
, pp. 955-972
-
-
Whitehouse, D.J.1
-
3
-
-
0004885956
-
Comparison of 2-dimensional fraunhofer approximation and 2-dimensional fresnel approximation at analysis of surface-roughness by angle speckle correlation. 2. Experimental results
-
Ohlidal, M. (1995). Comparison of 2-dimensional Fraunhofer approximation and 2-dimensional Fresnel approximation at analysis of surface-roughness by angle speckle correlation. 2. Experimental results. Journal of Modern Optics, 42 (10), 2081-2094.
-
(1995)
Journal of Modern Optics
, vol.42
, Issue.10
, pp. 2081-2094
-
-
Ohlidal, M.1
-
4
-
-
81255179399
-
Laser measurements of surface topography of abrasive tools using measurement system CLI 2000
-
Nadolny, K. et al. (2011). Laser measurements of surface topography of abrasive tools using measurement system CLI 2000. Przeglqd Elektrotechniczny (Electrical Review), 87 (9a), 24-27.
-
(2011)
Przeglqd Elektrotechniczny (Electrical Review)
, vol.87
, Issue.9 A
, pp. 24-27
-
-
Nadolny, K.1
-
5
-
-
0347392462
-
Optical system for measurement of surface form and roughness
-
Łukianowicz, C, Karpiński, T. (2001). Optical system for measurement of surface form and roughness. Measurement Science Review, 1 (1), 151-154.
-
(2001)
Measurement Science Review
, vol.1
, Issue.1
, pp. 151-154
-
-
Łukianowicz, C.1
Karpiński, T.2
-
6
-
-
80053321546
-
Shadow inspection of 3D objects in partially coherent light
-
Senchenko, E.S., Chugui, Yu.V. (2011). Shadow inspection of 3D objects in partially coherent light. Measurement Science Review, 11 (4), 104-107.
-
(2011)
Measurement Science Review
, vol.11
, Issue.4
, pp. 104-107
-
-
Senchenko, E.S.1
Chugui, Yu.V.2
-
7
-
-
84860190893
-
New scatterometer for spatial distribution measurements of light scattering from materials
-
Kawate, E., Hain, M. (2012). New scatterometer for spatial distribution measurements of light scattering from materials. Measurement Science Review, 12 (2), 56-61.
-
(2012)
Measurement Science Review
, vol.12
, Issue.2
, pp. 56-61
-
-
Kawate, E.1
Hain, M.2
-
8
-
-
0020932858
-
Statisticka analyza a jeji uplatneni pri hodnoceni mikrogeometrie povrchu
-
Bumbalek, B. (1983). Statistical-analysis and its use evaluating surface microgeometry. Kovove Materialy - Metallic Materials, 21 (6), 687-698. (Pubitemid 14528734)
-
(1983)
Kovove Materialy
, vol.21
, Issue.6
, pp. 687-698
-
-
Bumbalek Bohumil1
-
11
-
-
0348209092
-
Modeling of direct and inverse problems in light scattering by rough surfaces
-
Łukianowicz, C. (2003). Modeling of direct and inverse problems in light scattering by rough surfaces. Optica Applicata, 33 (2-3), 329-336.
-
(2003)
Optica Applicata
, vol.33
, Issue.2-3
, pp. 329-336
-
-
Łukianowicz, C.1
-
12
-
-
43849103641
-
Assessment of surface microroughness in movement by laser scatterometry and image stacking
-
Kapłonek, W., Łukianowicz, C. (2008). Assessment of surface microroughness in movement by laser scatterometry and image stacking. Przeglqd Elektrotechniczny (Electrical Review), 84 (5), 155-160.
-
(2008)
Przeglqd Elektrotechniczny (Electrical Review)
, vol.84
, Issue.5
, pp. 155-160
-
-
Kapłonek, W.1
Łukianowicz, C.2
|