Faults diagnosis and detection using principal component analysis and Kullback-Leibler divergence

IECON Proceedings (Industrial Electronics Conference)

Volumn , Issue , 2012, Pages 3907-3912

  Harmouche, Jinane ^a,b   Delpha, Claude ^a   Diallo, Demba ^b  

^a UNIV PARIS SUD   (France)

^b UNIV PARIS SUD   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CONFIDENCE LIMIT; CONTROL CHARTS; DIAGNOSIS CRITERIA; FAULT DETECTION AND ISOLATION; FAULTS DIAGNOSIS; KULLBACK LEIBLER DIVERGENCE; MONITORING CHARTS; PRINCIPAL SUBSPACE; PROBABILISTIC MEASURES; RESIDUAL SUBSPACES; T2 CHART; T2 CONTROL CHART;

FAULT DETECTION; FLOWCHARTING; INDUSTRIAL ELECTRONICS; INFORMATION THEORY; PROCESS MONITORING;

PRINCIPAL COMPONENT ANALYSIS;

EID: 84872903917     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IECON.2012.6389268     Document Type: Conference Paper

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