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Volumn 45, Issue 1, 2013, Pages 46-49

Organic ion yield enhancement in secondary ion mass spectrometry using water vapour injection

Author keywords

organic ion yield enhancement; SIMS; water vapour injection

Indexed keywords

DEUTERATED WATER; HIGH PRESSURE; ION INTENSITIES; ION YIELDS; ORGANIC SAMPLES; PROTONATED; SIGNAL ENHANCEMENT; STATIC SIMS; VAPOUR PRESSURES; WATER VAPOUR;

EID: 84872871125     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.5043     Document Type: Conference Paper
Times cited : (8)

References (17)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.