Pushing X-ray electron densities to the limit: Thermoelectric CoSb 3

Angewandte Chemie - International Edition

Volumn 52, Issue 5, 2013, Pages 1503-1506

  Stokkebro Schmøkel, Mette ^a   Bjerg, Lasse ^a   Overgaard, Jacob ^a   Krebs Larsen, Finn ^a   Hellerup Madsen, Georg Kent ^b   Sugimoto, Kunihisa ^c   Takata, Masaki ^c   Brummerstedt Iversen, Bo ^a  

^a AARHUS UNIVERSITY   (Denmark)

^b RUHR UNIVERSITY BOCHUM   (Germany)

^c JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE   (Japan)

Author keywords

electron density; low temperature physics; skutterudites; thermoelectric materials; X ray diffraction

Indexed keywords

COVALENTLY BONDED; ELECTROSTATIC PROPERTIES; EXPERIMENTAL ELECTRON DENSITY; LOW TEMPERATURES; POSITIVE CHARGES; SHORT-WAVELENGTH; THERMOELECTRIC MATERIAL;

COBALT; ELECTRON DENSITY MEASUREMENT; ELECTRONS; SKUTTERUDITES; THERMOELECTRICITY; X RAY DIFFRACTION;

CARRIER CONCENTRATION;

EID: 84872866413     PISSN: 14337851     EISSN: 15213773     Source Type: Journal    
DOI: 10.1002/anie.201206065     Document Type: Article

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