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Volumn 55, Issue 3, 1999, Pages 363-374

Accurate charge densities in days - Use of synchrotrons, image plates and very low temperatures

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0001594162     PISSN: 01087681     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0108768198010398     Document Type: Article
Times cited : (56)

References (39)
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    • 0003735713 scopus 로고    scopus 로고
    • Report ORNL-6895. Oak Ridge National Laboratory, Tennessee, USA
    • Burnett, M. N. & Johnson, C. K. (1996). ORTEPIII. Report ORNL-6895. Oak Ridge National Laboratory, Tennessee, USA.
    • (1996) ORTEPIII
    • Burnett, M.N.1    Johnson, C.K.2
  • 10
    • 85034125747 scopus 로고
    • Department of Chemistry, State University of New York at Buffalo, Buffalo, NY 14214, USA
    • Coppens, P. (1974). DATAP. Department of Chemistry, State University of New York at Buffalo, Buffalo, NY 14214, USA.
    • (1974) DATAP
    • Coppens, P.1
  • 13
    • 85034130003 scopus 로고
    • Private communication
    • Darovsky, A. (1995). Private communication.
    • (1995)
    • Darovsky, A.1
  • 23
    • 85034129711 scopus 로고    scopus 로고
    • Correction. University of Aarhus, DK-8000 Aarhus C, Denmark
    • Iversen, B. B. (1997). Correction. University of Aarhus, DK-8000 Aarhus C, Denmark.
    • (1997)
    • Iversen, B.B.1
  • 36
    • 85034149982 scopus 로고    scopus 로고
    • PhD thesis, University of Aarhus, DK-8000-Aarhus C, Denmark
    • Schultz, T. (1998). PhD thesis, University of Aarhus, DK-8000-Aarhus C, Denmark.
    • (1998)
    • Schultz, T.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.