SCOPUS 정보 검색 플랫폼

Volumn 527, Issue , 2013, Pages 205-209

Evaluation of elastic modulus of ultra-thin vermiculite membranes by contact mode atomic force microscopy imaging

Author keywords

Atomic force microscopy; Clay; Finite element analysis; Keywords; Mechanical properties; Membrane; Vermiculite

Indexed keywords

AFM; CIRCULAR HOLES; CONTACT MODE ATOMIC FORCE MICROSCOPY; CONTACT MODES; KEYWORDS; LAYERED SILICATE; PRE-STRESS; ULTRA-THIN; VERMICULITE;

ATOMIC FORCE MICROSCOPY; CLAY; CLAY MINERALS; ELASTIC MODULI; FINITE ELEMENT METHOD; MECHANICAL PROPERTIES; MULTILAYERS; SILICATES;

MEMBRANES;

EID: 84872615189 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/j.tsf.2012.12.024 Document Type: Article

Times cited : (23)

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