Thermo-optic characterization of long-range surface-plasmon devices in Cytop

Applied Optics

Volumn 52, Issue 2, 2013, Pages 162-170

  Fan, Hui ^a   Berini, Pierre ^a  

^a UNIVERSITY OF OTTAWA   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

METAL WORKING;

ACTIVE REGIONS; DESTRUCTIVE INTERFERENCE; ELECTROMIGRATION FAILURES; LONG-RANGE SURFACE PLASMONS; MEMORY EFFECTS; SAFETY LIMITS; STRAIGHT WAVEGUIDES; THERMO-OPTIC MODULATION;

REFRACTIVE INDEX;

EID: 84872591909     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.52.000162     Document Type: Article

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