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Volumn , Issue , 2011, Pages 219-222

One-class classification for Anomaly Detection in Wire Ropes with Gaussian processes in a few lines of code

Author keywords

[No Author keywords available]

Indexed keywords

ANOMALY DETECTION; BAYESIAN FRAMEWORKS; DEFECT LOCALIZATIONS; GAUSSIAN PROCESS; GAUSSIAN PROCESSES; KERNEL FUNCTION; LINES OF CODE; NON-PARAMETRIC; ONE-CLASS CLASSIFICATION; STATE OF THE ART; SUPPORT VECTOR DATA DESCRIPTION; VISUAL APPEARANCE;

EID: 84872513695     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (15)

References (15)
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  • 5
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    • One-class classification with gaussian processes
    • Michael Kemmler, Erik Rodner, and Joachim Denzler. One-class classification with gaussian processes. In ACCV, volume 2, pages 489-500, 2010.
    • (2010) ACCV , vol.2 , pp. 489-500
    • Kemmler, M.1    Rodner, E.2    Denzler, J.3
  • 6
    • 0142063407 scopus 로고    scopus 로고
    • Novelty detection: A review - Part 1: Statistical approaches
    • M. Markou and S. Singh. Novelty detection: a review - part 1: statistical approaches. Signal Processing, 83(12):2481-2497, 2003.
    • (2003) Signal Processing , vol.83 , Issue.12 , pp. 2481-2497
    • Markou, M.1    Singh, S.2
  • 7
    • 77957583572 scopus 로고    scopus 로고
    • Innovative procedure for visual rope inspection
    • D. Moll. Innovative procedure for visual rope inspection. Lift Report, 29(3):10-14, 2003.
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    • Moll, D.1
  • 8
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    • HMM-based defect localization in wire ropes - A new approach to unusual subsequence recognition
    • E.-S. Platzer, J. Nägele, K.-H. Wehking, and J. Denzler. HMM-Based Defect Localization in Wire Ropes - A New Approach to Unusual Subsequence Recognition. In DAGM, pages 442-451, 2009.
    • (2009) DAGM , pp. 442-451
    • Platzer, E.-S.1    Nägele, J.2    Wehking, K.-H.3    Denzler, J.4
  • 13
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    • Support vector data description
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  • 15
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    • A review of recent advances in surface defect detection using texture analysis techniques
    • X. Xie. A Review of Recent Advances in Surface Defect Detection using Texture analysis Techniques. Electronic Letters on Computer Vision and Image Analysis, 7(3):1-22, 2008.
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.