Improved depth resolution by single-exposure in-line compressive holography

Applied Optics

Volumn 52, Issue 1, 2013, Pages

  Rivenson, Yair ^a   Stern, Adrian ^a   Javidi, Bahram ^b  

^a BEN GURION UNIVERSITY OF THE NEGEV   (Israel)

^b UNIVERSITY OF CONNECTICUT   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

SIGNAL TO NOISE RATIO;

CELL IDENTIFICATION; COMPRESSIVE SENSING; DEPTH RESOLUTION; IN-LINE HOLOGRAPHY; LOW SIGNAL-TO-NOISE RATIO; NOISY ENVIRONMENT; OFF-AXIS HOLOGRAPHY; RAPID ACQUISITION;

HOLOGRAPHY;

EID: 84871980395     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.52.00A223     Document Type: Conference Paper

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