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Volumn 116, Issue , 2013, Pages 184-190

Comment on "A critical assessment of the Hapke photometric model" by Y. Shkuratov et al.

Author keywords

Photometry; Reflectance; Regolith

Indexed keywords

CHOICE OF PARAMETERS; CRITICAL ASSESSMENT; PHYSICAL PROCESS; PHYSICALLY BASED MODELS; REGOLITH;

EID: 84871931893     PISSN: 00224073     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jqsrt.2012.11.002     Document Type: Article
Times cited : (26)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.