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Volumn , Issue , 2005, Pages 253-258

A diagnostic toolto evaluate manufacturing execution systems improvements from operational and financial viewpoints

Author keywords

Key performance indicators; Manufacturing execution system; Multi level hierarchical model; Performance measurement

Indexed keywords

4-LEVEL; COMPETITIVE ADVANTAGE; DIFFERENTIAL EVALUATION; EXPECTED VALUES; HIERARCHICAL MODEL; HIERARCHICAL STRUCTURES; KEY PERFORMANCE INDICATORS; LINEAR RELATIONSHIPS; MANUFACTURING COMPANIES; MANUFACTURING EXECUTION SYSTEM; OPERATIONAL INDICATOR; PERFORMANCE MEASUREMENTS; QUALITATIVE STUDY; QUANTITATIVE EVALUATION; SIEMENS;

EID: 84871886379     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (1)

References (11)
  • 9
    • 0031377809 scopus 로고    scopus 로고
    • Implementation of overall equipment effectiveness (OEE) system at a semiconductor manufacturer
    • Austin, TX- ieeexplore.ieee.org
    • (S Giegling, WA Verdini, T Haymon, JM Konopka, 1997) "Implementation of Overall Equipment Effectiveness (OEE) system at a semiconductor manufacturer", SPS, Proceedings of 1997 IEMT Symposium, Austin, TX - ieeexplore.ieee.org, .
    • (1997) SPS, Proceedings of 1997 IEMT Symposium
    • Giegling, S.1    Verdini, W.A.2    Haymon, T.3    Konopka, J.M.4
  • 11


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.