The effects of device geometry and TCO/buffer layers on damp heat accelerated lifetime testing of Cu(In,Ga)Se2 solar cells

IEEE Journal of Photovoltaics

Volumn 3, Issue 1, 2013, Pages 494-499

  Thompson, Christopher P ^a   Hegedus, Steve ^a   Carcia, Peter ^b   McLean, R Scott ^b  

^a UNIVERSITY OF DELAWARE   (United States)

^b DUPONT COMPANY   (United States)

Author keywords

Accelerated aging; life testing; photovoltaic (PV) cells; thin film devices

Indexed keywords

ACCELERATED AGING; ACCELERATED LIFETIME TESTING; ACTIVE AREA; CU(IN , GA)SE; DAMP HEAT; DEVICE GEOMETRIES; INITIAL EFFICIENCY; LIFE-TESTING; PHOTOVOLTAIC; TRANSPARENT CONDUCTING OXIDE; WATER VAPOR TRANSMISSION RATE;

EFFICIENCY; GALLIUM; GLASS; POLYETHYLENE TEREPHTHALATES; SOLAR CELLS; THIN FILM DEVICES; ZINC OXIDE;

SELENIUM COMPOUNDS;

EID: 84871793344     PISSN: 21563381     EISSN: None     Source Type: Journal    
DOI: 10.1109/JPHOTOV.2012.2223454     Document Type: Article

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