Epitaxial growth of (111)-oriented LaAlO3/ LaNiO3 ultra-thin superlattices

Applied Physics Letters

Volumn 101, Issue 26, 2012, Pages

  Middey, S ^a   Meyers, D ^a   Kareev, M ^a   Moon, E J ^a   Gray, B A ^a   Liu, X ^a   Freeland, J W ^b   Chakhalian, J ^a,c  

^a UNIVERSITY OF ARKANSAS   (United States)

^b ARGONNE NATIONAL LABORATORY   (United States)

^c NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL QUALITY; COMPLEX OXIDES; ELEMENT SPECIFIC; EPITAXIAL STABILIZATION; HIGH QUALITY; SINGLE LAYER; SUPER-LATTICE STRUCTURES; ULTRA-THIN; X-RAY DIFFRACTION MEASUREMENTS;

EPITAXIAL GROWTH; INTERFACES (MATERIALS); LANTHANUM ALLOYS; TOPOLOGY; X RAY ABSORPTION SPECTROSCOPY; X RAY DIFFRACTION;

SUPERLATTICES;

EID: 84871790930     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4773375     Document Type: Article

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