A predictive optical simulation model for the rear-surface roughness of passivated silicon solar cells

IEEE Journal of Photovoltaics

Volumn 3, Issue 1, 2013, Pages 175-182

  Wöhrle, Nico ^a   Greulich, Johannes ^a,b   Schwab, Christoph ^a   Glatthaar, Markus ^a   Rein, Stefan ^a  

^a FRAUNHOFER INSTITUTE FOR SOLAR ENERGY SYSTEMS ISE   (Germany)

^b UNIVERSITY OF FREIBURG   (Germany)

Author keywords

Dielectric films; free carrier absorption (FCA); optical losses; optical reflection; ray tracing; rough surfaces

Indexed keywords

FREE CARRIER ABSORPTION; GENERATION RATE; IMPRECISE CALCULATION; MONTE-CARLO RAY TRACING; OPTICAL MODELING; OPTICAL REFLECTION; OPTICAL SIMULATION; PASSIVATION MATERIALS; PHONG MODEL; PHOTOGENERATED CURRENT; PHYSICS-BASED MODELS; PLANARIZATION; PRECISE SIMULATION; REAR SURFACES; ROUGH SURFACES; SPECTRAL REFLECTANCES; TRANSFER MATRIXES;

COMPUTER SIMULATION; DIELECTRIC FILMS; MONTE CARLO METHODS; OPTICAL LOSSES; PASSIVATION; RAY TRACING; SURFACE ROUGHNESS; TRANSFER MATRIX METHOD;

SILICON SOLAR CELLS;

EID: 84871749133     PISSN: 21563381     EISSN: None     Source Type: Journal    
DOI: 10.1109/JPHOTOV.2012.2215013     Document Type: Article

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