-
1
-
-
0028304539
-
-
10.1126/science.264.5158.553
-
J. Faist, F. Capasso, D. L. Sivco, C. Sirtori, A. L. Hutchinson, and A. Y. Cho, Science 22, 553 (1994). 10.1126/science.264.5158.553
-
(1994)
Science
, vol.22
, pp. 553
-
-
Faist, J.1
Capasso, F.2
Sivco, D.L.3
Sirtori, C.4
Hutchinson, A.L.5
Cho, A.Y.6
-
2
-
-
0035200459
-
-
10.1088/0034-4885/64/11/204
-
C. Gmachl, F. Capasso, D. L. Sivco, and A. Y. Cho, Rep. Prog. Phys. 64 (11), 1533 (2001). 10.1088/0034-4885/64/11/204
-
(2001)
Rep. Prog. Phys.
, vol.64
, Issue.11
, pp. 1533
-
-
Gmachl, C.1
Capasso, F.2
Sivco, D.L.3
Cho, A.Y.4
-
3
-
-
79960430639
-
-
10.1117/12.882698
-
A. K. Goyal, M. Spencer, M. Kelly, J. Costa, M. DiLiberto, E. Meyer, and T. Jeys, Proc. SPIE 8018, 80180N (2011). 10.1117/12.882698
-
(2011)
Proc. SPIE
, vol.8018
-
-
Goyal, A.K.1
Spencer, M.2
Kelly, M.3
Costa, J.4
Diliberto, M.5
Meyer, E.6
Jeys, T.7
-
4
-
-
84863896482
-
-
10.1117/12.918594
-
C. A. Kendziora, R. M. Jones, R. Furstenberg, M. Papantonakis, V. Nguyen, and R. A. McGill, Proc. SPIE 8373, 83732H (2012). 10.1117/12.918594
-
(2012)
Proc. SPIE
, vol.8373
-
-
Kendziora, C.A.1
Jones, R.M.2
Furstenberg, R.3
Papantonakis, M.4
Nguyen, V.5
McGill, R.A.6
-
5
-
-
79955773067
-
-
10.1117/12.874044
-
K. Degreif, S. Rademacher, P. Dasheva, F. Fuchs, S. Hugger, F. Schnürer, and W. Schweikert, Proc. SPIE 7945, 79450P (2011). 10.1117/12.874044
-
(2011)
Proc. SPIE
, vol.7945
-
-
Degreif, K.1
Rademacher, S.2
Dasheva, P.3
Fuchs, F.4
Hugger, S.5
Schnürer, F.6
Schweikert, W.7
-
6
-
-
78149254102
-
-
For a review on external cavity QCLs, see, 10.1088/0268-1242/25/8/083001
-
For a review on external cavity QCLs, see A. Hugi, R. Maulini, and J. Faist, Semicond. Sci. Technol. 25, 083001 (2010). 10.1088/0268-1242/25/8/083001
-
(2010)
Semicond. Sci. Technol.
, vol.25
, pp. 083001
-
-
Hugi, A.1
Maulini, R.2
Faist, J.3
-
7
-
-
79954470578
-
-
10.1063/1.3574555
-
E. Mujagic, C. Schwarzer, Y. Yao, J. Chen, C. Gmachl, and G. Strasser, Appl. Phys. Lett. 98, 141101 (2011). 10.1063/1.3574555
-
(2011)
Appl. Phys. Lett.
, vol.98
, pp. 141101
-
-
Mujagic, E.1
Schwarzer, C.2
Yao, Y.3
Chen, J.4
Gmachl, C.5
Strasser, G.6
-
8
-
-
67649584592
-
-
10.1109/JQE.2009.2013175
-
B. G. Lee, M. A. Belkin, C. Pflügl, L. Diehl, H. A. Zhang, R. M. Audet, J. MacArthur, D. P. Bour, S. W. Corzine, G. E. Höfler, and F. Capasso, IEEE J. Quantum Electron. 45, 554 (2009). 10.1109/JQE.2009.2013175
-
(2009)
IEEE J. Quantum Electron.
, vol.45
, pp. 554
-
-
Lee, B.G.1
Belkin, M.A.2
Pflügl, C.3
Diehl, L.4
Zhang, H.A.5
Audet, R.M.6
MacArthur, J.7
Bour, D.P.8
Corzine, S.W.9
Höfler, G.E.10
Capasso, F.11
-
9
-
-
79957521154
-
-
10.1063/1.3588412
-
Q. Y. Lu, Y. Bai, N. Bandyopadhyay, S. Slivken, and M. Razeghi, Appl. Phys. Lett. 98, 181106 (2011). 10.1063/1.3588412
-
(2011)
Appl. Phys. Lett.
, vol.98
, pp. 181106
-
-
Lu, Q.Y.1
Bai, Y.2
Bandyopadhyay, N.3
Slivken, S.4
Razeghi, M.5
-
10
-
-
12344329624
-
-
10.1109/LPT.2004.837478
-
H. Zhang, A. Seetharaman, P. Johnson, G. Luo, and H. Q. Le, IEEE Photon. Technol. Lett. 17 (1), 13 (2005). 10.1109/LPT.2004.837478
-
(2005)
IEEE Photon. Technol. Lett.
, vol.17
, Issue.1
, pp. 13
-
-
Zhang, H.1
Seetharaman, A.2
Johnson, P.3
Luo, G.4
Le, H.Q.5
-
11
-
-
79956030340
-
-
10.1063/1.1479453
-
M. Troccoli, C. Gmachl, F. Capasso, D. L. Sivco, and A. Y. Cho, Appl. Phys. Lett. 80 (22), 4103 (2002). 10.1063/1.1479453
-
(2002)
Appl. Phys. Lett.
, vol.80
, Issue.22
, pp. 4103
-
-
Troccoli, M.1
Gmachl, C.2
Capasso, F.3
Sivco, D.L.4
Cho, A.Y.5
-
12
-
-
34248382153
-
-
10.1049/el:20073297
-
H. Wenzel, K. Paschke, O. Brox, F. Bugge, J. Fricke, A. Ginolas, A. Knauer, P. Ressel, and G. Erbert, Electron. Lett. 43 (3), 160 (2007). 10.1049/el:20073297
-
(2007)
Electron. Lett.
, vol.43
, Issue.3
, pp. 160
-
-
Wenzel, H.1
Paschke, K.2
Brox, O.3
Bugge, F.4
Fricke, J.5
Ginolas, A.6
Knauer, A.7
Ressel, P.8
Erbert, G.9
-
13
-
-
0026187935
-
-
10.1109/3.83392
-
D. Mehuys, D. F. Welch, R. G. Waarts, R. Parke, A. Hardy, and W. Streifer, IEEE J. Quantum Electron. 27 (7), 1900 (1991). 10.1109/3.83392
-
(1991)
IEEE J. Quantum Electron.
, vol.27
, Issue.7
, pp. 1900
-
-
Mehuys, D.1
Welch, D.F.2
Waarts, R.G.3
Parke, R.4
Hardy, A.5
Streifer, W.6
-
14
-
-
80051732234
-
-
10.1364/OE.19.016229
-
S. Menzel, L. Diehl, C. Pflügl, A. Goyal, C. Wang, A. Sanchez, G. Turner, and F. Capasso, Opt. Express 19, 16229 (2011). 10.1364/OE.19.016229
-
(2011)
Opt. Express
, vol.19
, pp. 16229
-
-
Menzel, S.1
Diehl, L.2
Pflügl, C.3
Goyal, A.4
Wang, C.5
Sanchez, A.6
Turner, G.7
Capasso, F.8
-
15
-
-
37149012924
-
-
10.1109/JQE.2007.909516
-
A. Wittmann, T. Gresch, E. Gini, L. Hvozdara, N. Hoyler, M. Giovannini, and J. Faist, IEEE J. Quantum Electron. 44, 36 (2008). 10.1109/JQE.2007.909516
-
(2008)
IEEE J. Quantum Electron.
, vol.44
, pp. 36
-
-
Wittmann, A.1
Gresch, T.2
Gini, E.3
Hvozdara, L.4
Hoyler, N.5
Giovannini, M.6
Faist, J.7
-
16
-
-
0022756074
-
-
10.1109/JQE.1986.1073089
-
K. Utaka, S. Akiba, K. Sakai, and Y. Matsushima, IEEE J. Quantum Electron. 22, 1042 (1986). 10.1109/JQE.1986.1073089
-
(1986)
IEEE J. Quantum Electron.
, vol.22
, pp. 1042
-
-
Utaka, K.1
Akiba, S.2
Sakai, K.3
Matsushima, Y.4
-
18
-
-
0033726648
-
-
For the use of a two-section device for studying gain saturation, see, 10.1109/3.845731
-
For the use of a two-section device for studying gain saturation, see, S. Barbieri, C. Sirtori, H. Page, M. Beck, J. Faist, and J. Nagle, IEEE J. Quantum Electron. 36, 736 (2000). 10.1109/3.845731
-
(2000)
IEEE J. Quantum Electron.
, vol.36
, pp. 736
-
-
Barbieri, S.1
Sirtori, C.2
Page, H.3
Beck, M.4
Faist, J.5
Nagle, J.6
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