Nanostructured thermoelectric cobalt oxide by exfoliation/restacking route

Journal of Applied Physics

Volumn 112, Issue 11, 2012, Pages

  Kim, Jong Young ^a   Kim, Jin Il ^a   Choi, Soon Mok ^a   Soo Lim, Young ^a   Seo, Won Seon ^a   Jin Hwang, Hae ^b  

^a Korea Institute of Ceramic Engineering and Technology (KICET)   (South Korea)

^b Inha University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

BENEFICIAL EFFECTS; COBALT OXIDES; COMPOSITE OXIDE; FIGURE OF MERITS; HOLE-DOPING; INTERLAYER CATION; NANO LAYERS; NANO-STRUCTURED; OCTYLAMINES; POLYCRYSTALLINE; RESTACKING; SINTERING TEMPERATURES; SUPER-LATTICE STRUCTURES; TETRAMETHYLAMMONIUM; THERMOELECTRIC PROPERTIES;

CALCIUM; CALCIUM CHLORIDE; CARRIER CONCENTRATION; COBALT; COBALT COMPOUNDS; NANOSTRUCTURES; SINTERING; SODIUM COMPOUNDS; TWO DIMENSIONAL;

THERMAL CONDUCTIVITY;

EID: 84871183170     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4768258     Document Type: Article

References (50)

1. T. M. Tritt, Science 283, 804-805 (1999). 10.1126/science.283.5403.804
2. F. J. DiSalvo, Science 285, 703-706 (1999). 10.1126/science.285.5428.703
3. B. C. Sales, D. Mandrus, and R. K. Williams, Science 272, 1325-1328 (1996). 10.1126/science.272.5266.1325
4. S. J. Poon, Semicond. Semimetals 70, 37-75 (2001). 10.1016/S0080-8784(01) 80136-8
5. G. S. Nolas, J. L. Cohen, G. A. Slack, and S. B. Schujman, Appl. Phys. Lett. 73, 178-180 (1998). 10.1063/1.121747
6. K. F. Hsu, S. Loo, F. Guo, W. Chen, J. S. Dyck, C. Uher, T. Hogan, E. K. Polychroniadis, and M. G. Kanatzidis, Science 303, 818-821 (2004). 10.1126/science.1092963
7. P. F. P. Poudeu, J. D'Angelo, A. D. Downey, J. L. Short, T. P. Hogan, and M. G. Kanatzidis, Angew. Chem. Int. Ed. 45, 3835-3839 (2006). 10.1002/anie.200600865
8. H. Ohta, Y. Mune, K. Koumoto, T. Mizoguchi, and Y. Ikuhara, Thin Solid Films 516, 5916-5920 (2008). 10.1016/j.tsf.2007.10.034
9. I. Terasaki, Y. Sasago, and K. Uchinokura, Phys. Rev. B 56, R12685-R12687 (1997). 10.1103/PhysRevB.56.R12685
10. M. L. Foo, Y. Wang, S. Watauchi, H. W. Zandbergen, T. He, R. J. Cava, and N. P. Ong, Phys. Rev. Lett. 92, 247001-1-247001-4 (2004). 10.1103/PhysRevLett. 92.247001
11. S. Li, R. Funahashi, I. Matsubara, K. Ueno, and H. Yamada, J. Mater. Chem. 9, 1659-1660 (1999). 10.1039/a904413b
12. A. C. Masset, C. Michel, A. Maignan, M. Hervieu, O. Toulemonde, F. Studer, and B. Raveau, Phys. Rev. B 62, 166-175 (2000). 10.1103/PhysRevB.62.166
13. Y. Miyazaki, M. Onoda, T. Oku, M. Kikuchi, Y. Ishii, Y. Ono, Y. Morii, and T. Kajitani, J. Phys. Soc. Jpn. 71, 491-497 (2002). 10.1143/JPSJ.71.491
14. Y. Miyazaki, T. Miura, Y. Ono, and T. Kajitani, Jpn. J. Appl. Phys., Part 2 41, L849-L851 (2002). 10.1143/JJAP.41.L849
15. R. Funahashi, I. Matsubara, and S. Sodeoka, Appl. Phys. Lett. 76, 2385-2387 (2000). 10.1063/1.126354
16. H. Leligny, D. Grebille, O. Perez, A. C. Masset, M. Hervieu, and B. Raveau, Acta Crystallogr. Sec. B 56, 173-182 (2000). 10.1107/S0108768199012586
17. A. Maignan, S. Hebert, M. Hervieu, C. Michel, D. Pelloquin, and D. Khomskii, J. Phys. Condens. Matter 15, 2711-2723 (2003). 10.1088/0953-8984/15/ 17/323
18. M. Hervieu, A. Maignan, C. Michel, V. Hardy, N. Creon, and B. Raveau, Phys. Rev. B 67, 45112 (2003). 10.1103/PhysRevB.67.045112
19. R. Funahashi, I. Matsuhara, H. Ikuta, T. Takeuchi, U. Mizutani, and S. Sodeoka, Jpn. J. Appl. Phys., Part 2 39, L1127-L1129 (2000). 10.1143/JJAP.39.L1127
20. T. Yamamoto, K. Uchinokura, and I. Tsukada, Phys. Rev. B 65, 184434-1-184434-12 (2002). 10.1103/PhysRevB.65.184434
21. R. Funahashi and I. Matsuhara, Appl. Phys. Lett. 79, 362-364 (2001). 10.1063/1.1385187
22. T. Itoh and I. Terasaki, Jpn. J. Appl. Phys., Part 1 39, 6658-6660 (2000). 10.1143/JJAP.39.6658
23. S. Herbert, S. Lambert, D. Pelloquin, and A. Maignan, Phys. Rev. B 64, 172101-4 (2001). 10.1103/PhysRevB.64.172101
24. D. Pelloquin, A. Maignan, S. Herbert, C. Martin, M. Hervieu, C. Michel, L. B. Wang, and B. Raveau, Chem. Mater. 14, 3100-3105 (2002). 10.1021/cm020162p
25. W. Koshibae, K. Tsutsui, and S. Maekawa, Phys. Rev. B 62, 6869-6872 (2000). 10.1103/PhysRevB.62.6869
26. Y. Wang, N. S. Rogado, R. J. Cava, and N. P. Ong, Nature 423, 425-428 (2003). 10.1038/nature01639
27. T. C. Harman, P. J. Taylor, M. P. Walsh, and B. E. LaForge, Science 297, 2229-2232 (2002). 10.1126/science.1072886
28. A. I. Hochbaum, R. Chen, R. D. Delgado, W. Liang, E. C. Garnett, M. Najarian, A. Majumdar, and P. Yang, Nature 451, 163-167 (2008). 10.1038/nature06381
29. L. D. Hicks and M. S. Dresselhaus, Phys. Rev. B 47, 12727-12731 (1993). 10.1103/PhysRevB.47.12727
30. L. D. Hick and M. S. Dresselhaus, Phys. Rev. B 47, 16631-16634 (1993). 10.1103/PhysRevB.47.16631
31. L. D. Hicks, T. C. Harman, X. Sun, and M. S. Dresselhaus, Phys. Rev. B 53, R10493-R10496 (1996). 10.1103/PhysRevB.53.R10493
32. H. Ohta, S. Kim, Y. Mune, T. Mizoguchi, K. Nomura, S. Ohta, T. Nomura, Y. Nakanishi, Y. Ikuhara, M. Hirano, H. Hosono, and K. Koumoto, Nature Mater. 6, 129-134 (2007). 10.1038/nmat1821
33. K. Kurosaki, H. Muta, M. Uno, and S. Yamanaka, J. Alloys Compd. 315, 234-236 (2001). 10.1016/S0925-8388(00)01277-9
34. T. Seetawan, V. Amornkitbamrung, T. Burinprakhon, S. Maensiri, P. Tongbai, K. Kurosaki, H. Muta, M. Uno, and S. Yamanaka, J. Alloys Compd. 416, 291-295 (2006). 10.1016/j.jallcom.2005.08.035
35. J.-Y. Kim, J. I. Kim, and W.-S. Seo, Appl. Phys. Express 4, 065201-1-065201-3 (2011). 10.1143/APEX.4.065201
36. Y. Ando, N. Miyamoto, K. Segawa, T. Kawata, and T. Terasaki, Phys. Rev. B 60, 10580-1-10580-5 (1999). 10.1103/PhysRevB.60.10580
37. T. W. Kim, E. Oh, A. Jee, S. Lim, D. Park, M. Lee, S. Hyun, J. Choy, and S. Hwang, Chem. Eur. J. 15, 10752-10761 (2009). 10.1002/chem.200901590
38. K. Takada, H. Sakurai, E. Takayama-Muromachi, F. Izumi, R. A. Dilanian, and T. Sasaki, Nature 442, 53-55 (2003). 10.1038/nature01450
39. R. E. Schaak, T. Klimczuk, M. L. Foo, and R. J. Cava, Nature 424, 527-529 (2003). 10.1038/nature01877
40. P. Zhu, T. Takeuchi, H. Ohta, W. Seo, and K. Koumoto, Mater. Trans. 46, 1453-1455 (2005). 10.2320/matertrans.46.1453
41. J. W. G. Bos, J. T. Hertz, E. Morosan, and R. J. Cava, J. Solid State Chem. 180, 3211-3217 (2007). 10.1016/j.jssc.2007.09.002
42. R. Balsys and R. L. Davis, Solid State Ion. 69, 69-74 (1994). 10.1016/0167-2738(94)90451-0
43. N. W. Aschcroft and N. D. Mermin, Solid State Physics (Holt Saunders, Philadelphia, PA, 1976).
44. T. Kawata, Y. Iguchi, T. Itoh, K. Takahata, and I. Terasaki, Phys. Rev. B 60, 10584-10587 (1999). 10.1103/PhysRevB.60.10584
45. M. Lee, L. Viciu, L. Li, Y. Wang, M. Foo, S. Watauchi, R. A. Pascal, R. J. Cava, and N. P. Ong, Nature Mater. 5, 537-540 (2006). 10.1038/nmat1669
46. T. Motohashi, E. Naujalis, R. Ueda, K. Isawa, M. Karppinen, and H. Yamauchi, Appl. Phys. Lett. 79, 1480-1482 (2001). 10.1063/1.1400777
47. -2 for free electrons).
48. M. Tada, M. Yoshida, and H. Yasuda, J. Electron Mater. 39, 1439-1445 (2010). 10.1007/s11664-010-1309-y
49. J. C. Caylor, K. Coonley, J. Stuart, T. Colpitts, and R. Venkatasubramanian, Appl. Phys. Lett. 87, 023105-023105-3 (2005). 10.1063/1.1992662
50. See supplementary material at http://dx.doi.org/10.1063/1.4768258 E-JAPIAU-112-058223 for temperature dependence of Seebeck coefficient and electrical conductivity with error bars, thermal conductivity of 9, powder XRD patterns, and schematic model of restacking of NCO and LCO.