SCOPUS 정보 검색 플랫폼

Journal of Non-Crystalline Solids

Volumn 358, Issue 1, 2012, Pages 119-123

On the limitation of quantitative measurements using transmission electron microscopy

(1) Jiang, Nan a

a ARIZONA STATE UNIVERSITY (United States)

Author keywords

CaF2; Irradiation damage; Silicate glass; TEM STEM

Indexed keywords

CAF2; ELECTRON BEAM INTENSITY; INDUCED DAMAGE; IRRADIATION DAMAGE; LOCAL COMPOSITIONS; PRECISE MEASUREMENTS; QUANTITATIVE MEASUREMENT; SILICATE GLASS; SPATIAL RESOLUTION; TEM/STEM; ULTRA-HIGH;

ELECTRON BEAMS; ELECTRONS; FLUORSPAR; GLASS CERAMICS; NANOCRYSTALS; SILICATES; SODIUM; TRANSMISSION ELECTRON MICROSCOPY;

HIGH RESOLUTION ELECTRON MICROSCOPY;

EID: 80255123330 PISSN: 00223093 EISSN: None Source Type: Journal
DOI: 10.1016/j.jnoncrysol.2011.09.004 Document Type: Article

Times cited : (7)

References (20)

1
- 0037423244
- C.L. Jia, M. Lentzen, and K. Urban Science 299 2003 870
- (2003) Science , vol.299 , pp. 870
- Jia, C.L.¹ Lentzen, M.² Urban, K.³

2
- 4043175613
- D.A. Muller, N. Nakagawa, A. Ohtomo, J.L. Grazul, and H.Y. Hwang Nature 430 2004 657
- (2004) Nature , vol.430 , pp. 657
- Muller, D.A.¹ Nakagawa, N.² Ohtomo, A.³ Grazul, J.L.⁴ Hwang, H.Y.⁵

3
- 33644547026
- J.C.H. Spence Rep. Prog. Phys. 69 2006 725
- (2006) Rep. Prog. Phys. , vol.69 , pp. 725
- Spence, J.C.H.¹

4
- 33644928497
- R.F. Egerton, F. Wang, and P.A. Crozier Microsc. Microanal. 12 2006 65
- (2006) Microsc. Microanal. , vol.12 , pp. 65
- Egerton, R.F.¹ Wang, F.² Crozier, P.A.³

5
- 67650495713
- S. Zhou, N. Jiang, B. Wu, J. Hao, and J. Qiu Adv. Funct. Mater. 19 2009 2081
- (2009) Adv. Funct. Mater. , vol.19 , pp. 2081
- Zhou, S.¹ Jiang, N.² Wu, B.³ Hao, J.⁴ Qiu, J.⁵

6
- 42149188311
- S. Ye, B. Zhu, J. Chen, J. Luo, and J. Qiu Appl. Phys. Lett. 92 2008 141112
- (2008) Appl. Phys. Lett. , vol.92 , pp. 141112
- Ye, S.¹ Zhu, B.² Chen, J.³ Luo, J.⁴ Qiu, J.⁵

7
- 0003521799
- Plenum Press New York
- D.B. Williams, and C. Barry Transmission Electron Microscopy: A Textbook for Materials Science 1996 Plenum Press New York
- (1996) Transmission Electron Microscopy: A Textbook for Materials Science
- Williams, D.B.¹ Barry, C.²

8
- 66749137607
- S. Bhattacharyya, C. Bocker, T. Heil, J.R. Jinschek, T. Hoche, C. Russel, and H. Kohl Nano Lett. 9 2009 2493
- (2009) Nano Lett. , vol.9 , pp. 2493
- Bhattacharyya, S.¹ Bocker, C.² Heil, T.³ Jinschek, J.R.⁴ Hoche, T.⁵ Russel, C.⁶ Kohl, H.⁷

9
- 12144289012
- J.P. O'Neill, I.M. Ross, A.G. Cullis, T. Wang, and P.J. Parbrook Appl. Phys. Lett. 84 2004 1612
- (2004) Appl. Phys. Lett. , vol.84 , pp. 1612
- O'Neill, J.P.¹ Ross, I.M.² Cullis, A.G.³ Wang, T.⁴ Parbrook, P.J.⁵

10
- 4243131710
- L.D. Marks Rep. Prog. Phys. 57 1994 603
- (1994) Rep. Prog. Phys. , vol.57 , pp. 603
- Marks, L.D.¹

11
- 0000376987
- R. Bennewitz, D. Smith, and M. Reichling Phys. Rev. B 59 1999 8237
- (1999) Phys. Rev. B , vol.59 , pp. 8237
- Bennewitz, R.¹ Smith, D.² Reichling, M.³

12
- 44649098181
- K. Li, H. Xiao, and L.M. Wang Nucl. Instrum. Methods Phys. Res. B 266 2008 2698
- (2008) Nucl. Instrum. Methods Phys. Res. B , vol.266 , pp. 2698
- Li, K.¹ Xiao, H.² Wang, L.M.³

13
- 0004131511
- 2nd edition Interscience Publishers New York, New York
- R.W.G. Wyckoff Crystal Structures, volume 1 2nd edition 1963 Interscience Publishers New York, New York
- (1963) Crystal Structures, Volume 1
- Wyckoff, R.W.G.¹

14
- 0003394101
- 2nd edition Plenum Press New York
- R.F. Egerton Electron Energy Loss Spectroscopy in the Electron Microscopy 2nd edition 1996 Plenum Press New York
- (1996) Electron Energy Loss Spectroscopy in the Electron Microscopy
- Egerton, R.F.¹

15
- 0036531659
- N. Jiang Solid State Commun. 122 2002 7
- (2002) Solid State Commun. , vol.122 , pp. 7
- Jiang, N.¹

16
- 0141616532
- N. Jiang, J. Qiu, A. Ellison, and J. Silcox Phys. Rev. B 68 2003 064207
- (2003) Phys. Rev. B , vol.68 , pp. 064207
- Jiang, N.¹ Qiu, J.² Ellison, A.³ Silcox, J.⁴

17
- 80255122997
- J. Cazaux Ultramicroscopy 60 1995 422
- (1995) Ultramicroscopy , vol.60 , pp. 422
- Cazaux, J.¹

18
- 70349426842
- Electron energy loss studies semiconductors
- C.C. Ann, Wiley-VCH Weinheim
- P.E. Batson Electron energy loss studies semiconductors C.C. Ann, Transmission Electron Energy Loss Spectroscopy in Materials Science and the EELS Atlas 2004 Wiley-VCH Weinheim 353 384
- (2004) Transmission Electron Energy Loss Spectroscopy in Materials Science and the EELS Atlas , pp. 353-384
- Batson, P.E.¹

19
- 0032723949
- L.A.J. Garvie, and P.R. Buseck Am. Mineral. 84 1999 946
- (1999) Am. Mineral. , vol.84 , pp. 946
- Garvie, L.A.J.¹ Buseck, P.R.²

20
- 52649175475
- N. Jiang, S. Dong, J.C.H. Spence, S. Zhou, and J. Qiu J. Mater. Res. 23 2008 2467
- (2008) J. Mater. Res. , vol.23 , pp. 2467
- Jiang, N.¹ Dong, S.² Spence, J.C.H.³ Zhou, S.⁴ Qiu, J.⁵

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.