Optical characters measurement and simulation of 2D cross grating microstructures of butterfly wings

International Journal of Precision Engineering and Manufacturing

Volumn 13, Issue 9, 2012, Pages 1647-1653

  Zhang, Wang ^a   Zhang, Di ^a   Chen, Wei Xin ^a   Gu, Jia Jun ^a   Liu, Qin Lei ^a   Zhu, Shen Ming ^a   Su, Hui Lan ^a   Feng, Chuan Liang ^a   Moon, Won Jin ^b  

^a SHANGHAI JIAO TONG UNIVERSITY   (China)

^b Korea Basic Science Institute (KBSI)   (South Korea)

Author keywords

Butterfly; Microspectrophotometer; RCWA; Reflectance

Indexed keywords

MICROSTRUCTURE; REFRACTIVE INDEX;

BUTTERFLY; MEASUREMENT AND SIMULATION; MICROSPECTROPHOTOMETERS; RCWA; REFLECTANCE PROPERTIES; RIGOROUS COUPLED WAVE ANALYSIS; STRUCTURAL DIFFERENCES; TWO DIMENSIONAL MODEL;

REFLECTION;

EID: 84870566876     PISSN: 22347593     EISSN: 20054602     Source Type: Journal    
DOI: 10.1007/s12541-012-0216-y     Document Type: Article

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