Transmission electron microscopy observation of a single Ni dot fabricated using scanning tunneling microscopy

International Journal of Precision Engineering and Manufacturing

Volumn 11, Issue 3, 2010, Pages 469-472

  Hong, Chul Un ^a   Kang, Hyung Sub ^a   Kim, Seong Jong ^a   Kang, Sung Jun ^a   Kim, Gi Beum ^a  

^a Chonbuk National University   (South Korea)

Author keywords

GaAs epitaxial layer; Ni dot; STM; TEM

Indexed keywords

EID: 77955236773     PISSN: 12298557     EISSN: None     Source Type: Journal    
DOI: 10.1007/s12541-010-0054-8     Document Type: Article

References (5)

1. Aoki, N., Kikutani, T., Oki, A., Hori, H. and Yamada, S., "Normal-super-normal double tunneling junction fabricated in a split-gate wire," Superlattices and Microstructures, Vol. 22, No. 2, pp. 229-235, 1997.
2. Chaikool, P., Aketagawa, M. and Okuyama, E., "Direct Measurement of Spindle Motion Error Using a Regular Crystalline Lattice and a Scanning Tunneling Microscope," Int. J. Precis. Eng. Manuf., Vol. 9, No. 4, pp. 11-15, 2008.
3. Miskovsky, N. M. and Tsong, T. T., "Field evaporation of gold in single- and double-electrode systems," Phys. Rev. B, Vol. 46, No. 4, pp. 2640-2643, 1992.
4. Jeanneret, B., Gavilano, J. L., Racine, G. A., Leemann, Ch. And Martinoli, P., "Inductive conductance measurements in twodimensional superconducting systems," Appl. Phys. Lett., Vol. 55, No. 22, pp. 2336-2338, 1989.
5. Staufer, U., Scandella, L., Rudin, H., Guntherodt, H.-J. and Garcia, N., "Tailoring nanostructures with a scanning tunneling microscope," J. Vac. Sci. Technol. B, Vol. 9, No. 2, pp. 1389-1393, 1991.