Interpreting picosecond acoustics in the case of low interface stiffness

Review of Scientific Instruments

Volumn 83, Issue 11, 2012, Pages

  Hohensee, Gregory T ^a   Hsieh, Wen Pin ^a,b,c   Losego, Mark D ^a,d   Cahill, David G ^a  

^a University of Illinois at Urbana Champaign   (United States)

^b SLAC NATIONAL ACCELERATOR LABORATORY   (United States)

^c STANFORD UNIVERSITY   (United States)

^d North Carolina State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACCURATE MEASUREMENT; ANALYSIS OF DATA; INTERFACE STIFFNESS; METAL FILM; NATIVE OXIDES; OPTICAL TRANSDUCERS; PICOSECOND ACOUSTICS; PROPAGATION OF UNCERTAINTIES; TEMPERATURE DEPENDENT; THERMAL TRANSPORT PROPERTIES; TIME DOMAIN THERMOREFLECTANCE;

OPTICAL PUMPING; THICKNESS MEASUREMENT; TIME DOMAIN ANALYSIS; TRANSDUCERS; TRANSPORT PROPERTIES; UNCERTAINTY ANALYSIS;

ACOUSTOOPTICAL EFFECTS;

EID: 84870534349     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4766957     Document Type: Article

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