Transmission electron microscopy and Raman characterization of copper (I) oxide microspheres composed of nanoparticles

Applied Surface Science

Volumn 264, Issue , 2013, Pages 399-403

  Wang, Wenzhong ^a   Tu, Ya ^a   Wang, Lijuan ^a   Liang, Yujie ^a   Shi, Honglong ^a  

^a MINZU UNIVERSITY OF CHINA   (China)

Author keywords

Crystal structure; Nanostructures; Raman scattering; Semiconductors

Indexed keywords

COPPER OXIDES; CRYSTAL STRUCTURE; DEFECTS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; MICROSPHERES; MICROSTRUCTURE; NANOPARTICLES; NANOSTRUCTURES; RAMAN SCATTERING; RAMAN SPECTROSCOPY; SEMICONDUCTOR MATERIALS;

BULK CRYSTALS; HIGH-RESOLUTION TRANSMISSION ELECTRON MICROSCOPES; INFRARED ACTIVE MODES; INVERSION SYMMETRY; RAMAN CHARACTERIZATION; RAMAN SCATTERING SPECTRA; RANDOM GROWTH; SCATTERING PROPERTY;

CRYSTAL SYMMETRY;

EID: 84870479381     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2012.10.033     Document Type: Article

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