Formation of stable Cu2O nanocrystals in a new orthorhombic crystal structure

Materials Science and Engineering: A

Volumn 304-306, Issue 1-2, 2001, Pages 805-809

  Ram, S ^a   Mitra, C ^a  

^a INDIAN INSTITUTE OF TECHNOLOGY   (India)

Author keywords

Cu2O nanocrystals; Cu2O semiconductor; Cu2O synthesis; Orthorhombic Cu2 structure; Stable Cu2O

Indexed keywords

COPPER; CRYSTAL STRUCTURE; ION EXCHANGE; LATTICE CONSTANTS; OXIDATION; SOLUTIONS; X RAY DIFFRACTION ANALYSIS;

NANOCRYSTALS;

NANOSTRUCTURED MATERIALS;

MICROSTRUCTURE; PHYSICAL PROPERTY;

EID: 0035978663     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5093(00)01578-1     Document Type: Article

References (21)

1. Grozdanov I. Mater. Lett. 19:1994;281.
2. Shen M.Y., Yokouchi T., Koyama S., Goto T. Phys. Rev. B. 56:1997;13066.
3. Shi W., Lim K., Lin X. J. Appl. Phys. 81:1997;2822.
4. Caswell N., Yu P.Y. Phys. Rev. B. 25:1982;5519.
5. Hulin D., Mysyrowicz A., á la Guillaume C.B. Phys. Rev. B. 45:1980;1970.
6. Amikura H., Masumi T. J. Phys. Soc. Jpn. 64:1995;2684.
7. Mukhopadhyay A.K., Chakraborty A.K., Chatterji A.P., Lahiri S.K. Thin Solid Films. 209:1992;92.
8. Yang J.C., Kolasa B., Gibson J. Appl. Phys. Lett. 73:1998;2841.
9. Cabrera N., Mott N.F. Rep. Prog. Phys. 12:1948;163.
10. Palkar V.R., Ayyub P., Chattopadhyay S., Multani M. Phys. Rev. B. 53:1996;2167.
11. JCPDS X-ray powder diffraction file 5.667.
12. Ghijsen J., Tjeng L.H., Van Elp J., Eskes H., Westerink J., Sawatzky G.A., Czyzyk M.T. Phys. Rev. B. 38:1988;11322.
13. Ito T., Yamaguchi H., Okabe S., Masumi T. J. Mater. Sci. 33:1998;3555.
14. Ram S., Fabri M., Fecht H.J., Joubert J.C. Nanostruct. Mater. 6:1995;473.
15. Ram S., Fecht H.J., Haldar S., Ramachandrarao P., Banerjee H.D. Phys. Rev. B. 56:1997;726.
16. Langford J.I. J. Appl. Crystallogr. 11:1978;10.
17. T. Allen, Particle Size Measurements, Chapman & Hall, London, 1975, p. 358.
18. Ram S., Johari G.P. Phil. Mag. B. 61:1990;299.
19. Ashoori R.C. Nature. 379:1996;413.
20. Trapp S., Limbach C.T., Gonser U., Campbell S.J., Gleiter H. Phys. Rev. Lett. 75:1995;3760.
21. Nakamura N., Ishiwari S., Tanaka A. Appl. Phys. Lett. 73:1998;2325.