The cognitive load affects the interaction pattern of emotion and working memory

International Journal of Cognitive Informatics and Natural Intelligence

Volumn 6, Issue 2, 2012, Pages 68-81

  Li, Xuebing ^a   Ouyang, Zhengzheng ^a   Luo, Yue Jia ^b  

^a CHINESE ACADEMY OF SCIENCES   (China)

^b BEIJING NORMAL UNIVERSITY   (China)

Author keywords

Cognitive load; Emotion; Event related potentials; Event related potentials technique; Working memory

Indexed keywords

COGNITIVE LOADS; EMOTION; EVENT-RELATED-POTENTIALS; EVENT-RELATED-POTENTIALS TECHNIQUE; WORKING MEMORIES;

ARTIFICIAL INTELLIGENCE;

HUMAN COMPUTER INTERACTION;

EID: 84870270471     PISSN: 15573958     EISSN: 15573966     Source Type: Journal    
DOI: 10.4018/jcini.2012040104     Document Type: Article

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