Unexpected surface sensitivity at high energies in angle-resolved photoemission

Physical Review B - Condensed Matter and Materials Physics

Volumn 66, Issue 24, 2002, Pages 1-5

  Hofmann, Ph ^a   Søndergaard, Ch ^a   Agergaard, S ^a   Hoffmann, S V ^a   Gayone, J E ^b   Zampieri, G ^b   Lizzit, S ^c   Baraldi, A ^d,e  

^a AARHUS UNIVERSITY   (Denmark)

^b CENTRO ATÓMICO BARILOCHE   (Argentina)

^c SINCROTRONE TRIESTE   (Italy)

^d UNIVERSITY OF TRIESTE   (Italy)

^e LABORATORIO TASC   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84870262322     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.66.245422     Document Type: Article

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17. Our calculations do not account for the energy dependence of photoemission matrix elements. This is, however, of no consequence here because we only want to study the effect of phonon emission on the intensity and on the probing depth.