Multi-scale partial intrinsic symmetry detection

ACM Transactions on Graphics

Volumn 31, Issue 6, 2012, Pages

  Xu, Kai ^a,b   Zhang, Hao ^c   Jiang, Wei ^a   Dyer, Ramsay ^d   Cheng, Zhiquan ^a   Liu, Ligang ^e   Chen, Baoquan ^b  

^a National University of Defense Technology   (Canada)

^b SHENZHEN INSTITUTES OF ADVANCED TECHNOLOGY   (China)

^c SIMON FRASER UNIVERSITY   (Canada)

^d INRIA   (France)

^e UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA   (China)

Author keywords

[No Author keywords available]

Indexed keywords

3-D SHAPE; COMPLEX SHAPES; DIFFERENT SCALE; INTRINSIC DISTANCES; INTRINSIC SYMMETRIES; MULTIPLE SCALE; MULTISCALES; SAMPLE POINT; SECOND-LEVEL; SPECTRAL CLUSTERING; TWO-POINT;

ALGORITHMS;

MOLECULAR PHYSICS;

EID: 84870217184     PISSN: 07300301     EISSN: 15577368     Source Type: Journal    
DOI: 10.1145/2366145.2366200     Document Type: Conference Paper

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