Symmetry detection using feature lines

Computer Graphics Forum

Volumn 28, Issue 2, 2009, Pages 697-706

  Bokeloh, M ^a   Berner, A ^a   Wand, M ^b,c   Seidel, H P ^c   Schilling, A ^a  

^a UNIVERSITY OF TÜBINGEN   (Germany)

^b SAARLAND UNIVERSITY   (Germany)

^c MAX PLANCK INSTITUTE FOR INFORMATICS   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER GRAPHICS; METAL DRAWING;

GENERAL PATTERNS; PROCESSING COSTS; REGULAR PATTERNS; RELEVANT FEATURES; STRUCTURAL REDUNDANCY; SURFACE MODELING; SYMMETRY DETECTION; VERY LARGE DATUM;

METAL DRAWING; COMPUTER GRAPHICS;

EID: 63049109301     PISSN: 01677055     EISSN: 14678659     Source Type: Journal    
DOI: 10.1111/j.1467-8659.2009.01410.x     Document Type: Article

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