ZnO dense nanowire array on a film structure in a single crystal domain texture for optical and photoelectrochemical applications

Nanotechnology

Volumn 23, Issue 49, 2012, Pages

  Zhong, Miao ^a   Sato, Yukio ^a   Kurniawan, Mario ^a   Apostoluk, Aleksandra ^b   Masenelli, Bruno ^b   Maeda, Etsuo ^a   Ikuhara, Yuichi ^a   Delaunay, Jean Jacques ^a  

^a UNIVERSITY OF TOKYO   (Japan)

^b UNIVERSITÉ DE LYON   (France)

Author keywords

[No Author keywords available]

Indexed keywords

A-PLANE SAPPHIRE; ANTI-CORROSIVE; CORE-SHELL NANOWIRES; CRYSTAL DOMAIN; CRYSTALLINE ORIENTATIONS; CVD PROCESS; DIFFUSION-REACTION PROCESS; ELECTROCHEMICAL IMPEDANCE ANALYSIS; FILM STRUCTURE; GROWTH MECHANISMS; HIGH-CRYSTALLINE QUALITY; LOW-TEMPERATURE PHOTOLUMINESCENCE SPECTROSCOPY; N-TYPE CONDUCTIVITY; NANOWIRE ARRAYS; OUT-OF-PLANE; PHOTOANODE; PHOTOELECTROCHEMICAL APPLICATIONS; PHOTOELECTROCHEMICAL PERFORMANCE; PHOTOELECTROCHEMICALS; SINGLE-CRYSTAL QUALITY; WATER SPLITTING; ZNO; ZNO FILMS; ZNO NANOSTRUCTURES; ZNO NANOWIRE ARRAYS;

CHEMICAL VAPOR DEPOSITION; CRYSTALLINE MATERIALS; ELECTROCHEMISTRY; FILM GROWTH; NANOWIRES; SAPPHIRE; SINGLE CRYSTALS; SUBSTRATES; TEXTURES; THICK FILMS; ZINC OXIDE;

INTERFACES (MATERIALS);

NANOTUBE; ZINC OXIDE;

ARTICLE; ARTIFICIAL MEMBRANE; CHEMISTRY; CRYSTALLIZATION; ELECTROCHEMISTRY; ELECTRODE; INSTRUMENTATION; LIGHT; MATERIALS TESTING; METHODOLOGY; PHOTOCHEMISTRY; RADIATION EXPOSURE;

CRYSTALLIZATION; ELECTROCHEMISTRY; ELECTRODES; LIGHT; MATERIALS TESTING; MEMBRANES, ARTIFICIAL; NANOTUBES; PHOTOCHEMISTRY; ZINC OXIDE;

EID: 84870033801     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/23/49/495602     Document Type: Article

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