X-ray diffraction study of nanocrystalline and amorphous structure within major and minor ampullate dragline spider silks

Soft Matter

Volumn 8, Issue 25, 2012, Pages 6713-6722

  Sampath, Sujatha ^a   Isdebski, Thomas ^a   Jenkins, Janelle E ^a,d   Ayon, Joel V ^a   Henning, Robert W ^b   Orgel, Joseph P R O ^c   Antipoa, Olga ^c   Yarger, Jeffery L ^a  

^a ARIZONA STATE UNIVERSITY   (United States)

^b UNIVERSITY OF CHICAGO   (United States)

^c Illinois Institute of Technology   (United States)

^d SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS COMPONENT; AMORPHOUS MATRICES; AMORPHOUS STRUCTURES; ARGIOPE AURANTIA; CRYSTALLINE COMPONENTS; CRYSTALLINITIES; DEGREE OF ORDER; DIFFRACTION RINGS; FIBER AXIS; L-ALANINE; NANOCRYSTALLINES; NEPHILA CLAVIPES; SEMICRYSTALLINES; SPIDER SILKS; SUPERLATTICE REFLECTIONS; SYNCHROTRON X RAYS; WIDE-ANGLE X-RAY DIFFRACTION; X-RAY DIFFRACTION STUDIES;

AMINO ACIDS; CRYSTALLINE MATERIALS; MECHANICAL PROPERTIES; NANOCRYSTALLITES; X RAY DIFFRACTION;

SILK;

CRYSTAL STRUCTURE; NATURAL FIBERS; SILK; X RAY DIFFRACTION;

ARANEAE; ARGIOPE AURANTIA; NEPHILA CLAVIPES;

EID: 84869596313     PISSN: 1744683X     EISSN: 17446848     Source Type: Journal    
DOI: 10.1039/c2sm25373a     Document Type: Article

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