Correlated lifetimes of free paraexcitons and excitons trapped at oxygen vacancies in cuprous oxide

Journal of Luminescence

Volumn 134, Issue , 2013, Pages 524-527

  Koirala, Sandhaya ^a   Naka, Nobuko ^a,b   Tanaka, Koichiro ^a,c  

^a KYOTO UNIVERSITY   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^c KYOTO UNIVERSITY   (Japan)

Author keywords

Defect levels; Excitons; Impurities

Indexed keywords

CUPROUS OXIDE; DEFECT LEVELS; FREE EXCITONS; OXYGEN CONCENTRATIONS; PARA-EXCITONS; TRAPPED EXCITON;

EXCITONS; IMPURITIES;

OXYGEN VACANCIES;

EID: 84869498054     PISSN: 00222313     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jlumin.2012.07.035     Document Type: Article

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