MOSFET mismatch in weak/moderate inversion: Model needs and implications for analog design

European Solid-State Circuits Conference

Volumn , Issue , 2003, Pages 671-674

  Vancaillie, L ^a   Silveira, F ^b   Linares Barranco, B ^c   Serrano Gotarredona, T ^c   Flandre, D ^a  

^a UNIVERSITÉ CATHOLIQUE DE LOUVAIN   (Belgium)

^b UNIVERSIDAD DE LA REPÚBLICA   (Uruguay)

^c INSTITUTO DE MICROELECTRÓNICA DE SEVILLA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

ANALOG DESIGN; BODY EFFECT FACTOR; CMOS TECHNOLOGY; CURRENT MIRRORS; MISMATCH MEASUREMENT; MODERATE INVERSION; MOSFET MISMATCH; OPERATING TEMPERATURE RANGES;

CMOS INTEGRATED CIRCUITS;

EID: 84869470062     PISSN: 19308833     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ESSCIRC.2003.1257224     Document Type: Conference Paper

References (9)

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