Residual and bending stress measurements by X-ray diffraction and synchrotron diffraction analysis in silicon solar cells

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 2012, Pages 442-447

  Popovich, V A ^a   Van Der Pers, N ^a   Janssen, M ^a   Bennett, I J ^b   Jansen, K M B ^c   Wright, J ^d   Richardson, I M ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b TNO   (Netherlands)

^c DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^d EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

metallic contacts; multicrystalline silicon solar cells; residual stress

Indexed keywords

BACK CONTACT; FRACTURE RATES; IN-SITU BENDING TESTS; LASER SCANNING DEVICE; MECHANICAL STRESS; METALLIC CONTACTS; MULTI-CRYSTALLINE SILICON SOLAR CELLS; PROCESSING STEPS; SCREEN-PRINTED SOLAR CELLS; STRESS GRADIENT; SYNCHROTRON DIFFRACTION; SYNCHROTRON MEASUREMENTS; WAFER STRENGTH; WAFER THICKNESS;

ALUMINUM; FIRING (OF MATERIALS); POLYSILICON; RESIDUAL STRESSES; SILICON WAFERS; SILVER; STRESS MEASUREMENT; X RAY DIFFRACTION;

SILICON SOLAR CELLS;

EID: 84869412268     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PVSC.2012.6317653     Document Type: Conference Paper

References (4)

1. Withers PJ, Bhadeshia HKDH, Overview: Residual Stress, Part I-Measurement Techniques, Materials Science and Technology 17, pp. 355, 2000.
2. V.A. Popovich, M. Janssen, LM. Richardson, T. van Arstel and U. Bennett, Microstructure and mechanical properties of aluminium back contact layers, Solar Energy Materials and Solar Cells, Volume 95, Issue I, pp. 93-96, January 2011.
3. M. Hilali, Understanding and development of manufacturable screen printed contacts on high sheet resistance emitters for low-cost silicon solar cells, 2005.
4. V.A. Popovich, A. Yunus, M. Janssen, LM. Richardson, U. Bennett, Effect of silicon solar cell processing parameters and crystallinity on mechanical strength, Solar Energy Materials and Solar Cells, Volume 95, Issue 1, pp. 97-100, 2011.