Polarization effects on contrast in structured illumination microscopy

Optics Letters

Volumn 37, Issue 22, 2012, Pages 4603-4605

  O'Holleran, Kevin ^a   Shaw, Michael ^a  

^a NATIONAL PHYSICAL LABORATORY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELDS; IMAGE RECONSTRUCTION; NUMERICAL METHODS; RAY TRACING;

MICROSCOPE OBJECTIVE; POLARIZATION EFFECT; POLARIZATION ROTATION; POLARIZATION STATE; RAY-TRACING METHOD; STRUCTURED ILLUMINATION; STRUCTURED ILLUMINATION MICROSCOPY; SUPER RESOLUTION IMAGING;

POLARIZATION;

EID: 84869175040     PISSN: 01469592     EISSN: 15394794     Source Type: Journal    
DOI: 10.1364/OL.37.004603     Document Type: Article

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