Analysis of optical and related properties of tin oxide thin films determined by Drude-Lorentz model

Surface and Coatings Technology

Volumn 211, Issue , 2012, Pages 45-49

  Kadi, Mohamed ^a   Smaali, Assia ^a   Outemzabet, Ratiba ^a  

^a UNIVERSITY OF SCIENCES AND TECHNOLOGY HOUARI BOUMEDIENE   (Algeria)

Author keywords

Dispersion; Doping; Extinction; Refraction; Thin films; Tin oxide

Indexed keywords

CHEMICAL COMPOSITIONS; DEPOSITED FILMS; DIELECTRIC FUNCTIONS; DISPERSION RELATIONS; DOPED FILMS; DRUDE MODELS; DRUDE-LORENTZ MODEL; EXTINCTION COEFFICIENTS; HIGH-FREQUENCY DIELECTRICS; INFRARED DOMAINS; LORENTZIAN OSCILLATOR; NIR WAVELENGTH; OPTICAL PARAMETER; OPTICAL REFLECTANCE SPECTRA; PHOTON ENERGY; PLASMA FREQUENCIES; PURE TIN; SPECTRAL RANGE; TIN OXIDE THIN FILM;

DEPOSITS; DISPERSION (WAVES); DISPERSIONS; DOPING (ADDITIVES); FILM THICKNESS; LIGHT EXTINCTION; OXIDE FILMS; PLASMA WAVES; REFLECTION; REFRACTION; REFRACTIVE INDEX; THIN FILMS; TIN; TIN OXIDES;

SEMICONDUCTOR DOPING;

EID: 84868651178     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.surfcoat.2011.10.027     Document Type: Article

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