Development of a new quantitative X-ray microanalysis method for electron microscopy

Microscopy and Microanalysis

Volumn 16, Issue 6, 2010, Pages 821-830

  Horny, Paula ^a,b   Lifshin, Eric ^c   Campbell, Helen ^a   Gauvin, Raynald ^a  

^a MCGILL UNIVERSITY   (Canada)

^b UNIVERSITÉ LAVAL   (Canada)

^c STATE UNIVERSITY OF NEW YORK   (United States)

Author keywords

field emission scanning electron microscope; Monte Carlo simulation; quantitative X ray microanalysis; standardless microanalysis

Indexed keywords

EID: 79451471771     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927610094018     Document Type: Conference Paper

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