Precision measurement of electrical charge with optomechanically induced transparency

Physical Review A - Atomic, Molecular, and Optical Physics

Volumn 86, Issue 5, 2012, Pages

  Zhang, Jian Qi ^a   Li, Yong ^b   Feng, Mang ^a   Xu, Yi ^c,d  

^a Wuhan National Laboratory for Optoelectronics   (China)

^b BEIJING COMPUTATIONAL SCIENCE RESEARCH CENTER   (China)

^c SOUTH CHINA NORMAL UNIVERSITY   (China)

^d GUANGZHOU UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

BACKACTION; CHARGE NUMBER; CONVENTIONAL MEASUREMENTS; ELECTRICAL CHARGES; EXPERIMENTAL VALUES; MECHANICAL RESONATORS; OPTOMECHANICAL SYSTEMS; OPTOMECHANICALLY INDUCED TRANSPARENCIES; PRACTICAL SCHEMES; PRECISION MEASUREMENT; WINDOW WIDTH;

MATHEMATICAL MODELS; PHYSICS;

TRANSPARENCY;

EID: 84868381259     PISSN: 10502947     EISSN: 10941622     Source Type: Journal    
DOI: 10.1103/PhysRevA.86.053806     Document Type: Article

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