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Journal of Alloys and Compounds

Volumn 549, Issue , 2013, Pages 238-244

Structural characterization, electrical and dielectric relaxations in Dy-doped zirconia

(3) Raghvendra, a Singh, Prabhakar a Singh, Rajesh Kumar a

a BANARAS HINDU UNIVERSITY (India)

Author keywords

Ceramics; Dielectric response; Grain boundaries; Ion conduction; Oxide materials

Indexed keywords

AVERAGE GRAIN SIZE; CERAMICS; CONDUCTIVITY SPECTRA; DIELECTRIC RESPONSE; DOPED ZIRCONIA; ELECTRICAL CONDUCTIVITY; FREQUENCY DEPENDENCE; FREQUENCY RANGES; FT-IR SPECTRUM; HOMOGENEOUS DISTRIBUTION; ION CONDUCTION; MONOCLINIC PHASE; OPTICALLY ACTIVE; OXIDE MATERIALS; REAL PART; ROOM TEMPERATURE; SEM MICROGRAPHS; SOLID-STATE ROUTES; SPACE CHARGE POLARIZATION; SPHERICAL GRAINS; STRUCTURAL CHARACTERIZATION; TANGENT LOSS; TEMPERATURE DEPENDENCE; TEMPERATURE DEPENDENT; TEMPERATURE RANGE; UV SPECTRUM; XRD;

ACTIVATION ENERGY; DIELECTRIC MATERIALS; DIELECTRIC PROPERTIES; DYSPROSIUM; ELECTRIC CONDUCTIVITY; FOURIER TRANSFORM INFRARED SPECTROSCOPY; GRAIN BOUNDARIES; RIETVELD ANALYSIS; ULTRAVIOLET SPECTROSCOPY; ZIRCONIUM;

ZIRCONIA;

EID: 84868248564 PISSN: 09258388 EISSN: None Source Type: Journal
DOI: 10.1016/j.jallcom.2012.09.059 Document Type: Article

Times cited : (17)

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