Analog circuit fault diagnosis using multi-wavelet transform and SVM

Proceedings - 2012 3rd International Conference on Digital Manufacturing and Automation, ICDMA 2012

Volumn , Issue , 2012, Pages 214-217

  Hu, Yunyan ^a   Peng, Minfang ^a   Tian, Chenglai ^a   Tan, Hu ^a  

^a HUNAN UNIVERSITY   (China)

Author keywords

analog circuit; fault diagnosis; multi wavelet transform; SVM

Indexed keywords

ANALOG FAULT; ENERGY NORMALIZATION; FAULT FEATURE; MULTI-WAVELET TRANSFORM; RESPONSE SIGNAL; SVM;

ANALOG CIRCUITS; FAILURE ANALYSIS; MANUFACTURE;

SUPPORT VECTOR MACHINES;

EID: 84868235255     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICDMA.2012.52     Document Type: Conference Paper

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