Neural network method of fault diagnosis for large-scale analogue circuits

Chinese Journal of Electronics

Volumn 12, Issue 1, 2003, Pages 57-60

  Tan, Yanghong ^a   He, Yigang ^a   Wu, Jie ^a  

^a HUNAN UNIVERSITY   (China)

Author keywords

Fault diagnosis; Large scale analogue circuits; Neural network; Tolerance

Indexed keywords

BACKPROPAGATION; CALCULATIONS; COMPUTATIONAL COMPLEXITY; COMPUTER SIMULATION; NEURAL NETWORKS; RELIABILITY;

BACKPROPAGATION NEURAL NETWORKS; FAULT DETECTION AND DIAGNOSIS; LARGE SCALE ANALOGUE CIRCUITS; SOFTWARE PACKAGE PSPICE;

INTEGRATED CIRCUIT TESTING;

EID: 0037217657     PISSN: 10224653     EISSN: 20755597     Source Type: Journal    
DOI: None     Document Type: Article

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